Hostname: page-component-848d4c4894-75dct Total loading time: 0 Render date: 2024-06-13T04:20:48.843Z Has data issue: false hasContentIssue false
  • English
  • Français

Real-Space Observation of a Transformation from Antiskyrmion to Skyrmion by Lorentz TEM

Published online by Cambridge University Press:  05 August 2019

Licong Peng ,
Rina Takagi ,
Wataru Koshibae ,
Kiyou Shibata ,
Taka-hisa Arima ,
Naoto Nagaosa ,
Yoshinori Tokura ,
Shinichiro Seki  and
Xiuzhen Yu
Licong Peng*
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Rina Takagi
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Wataru Koshibae
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Kiyou Shibata
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Taka-hisa Arima
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Advanced Materials Science, University of Tokyo, Kashiwa, Chiba, Japan.
Naoto Nagaosa
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Applied Physics, University of Tokyo, Tokyo, Japan.
Yoshinori Tokura
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Applied Physics, University of Tokyo, Tokyo, Japan.
Shinichiro Seki
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Xiuzhen Yu
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
*
*Corresponding author: licong.peng@riken.jp.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1840 - 1841
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yu, XZ et al. , Nature 465 (2010), p. 901.Google Scholar
[2]Nayak, AK et al. , Nature 548 (2017), p. 561.Google Scholar
[3]Nagaosa, N and Tokura, Y, Nat. Nanotech. 8 (2013), p. 899.Google Scholar
[4]Ishizuka, K and Allman, B, J. Electron Microsc. 54 (2005), p. 191.Google Scholar
[5]The authors thank Y. Taguchi for experimental discussions and thank M. Ishida and K. Nakajima for technical assistance.Google Scholar