Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-15T02:47:14.710Z Has data issue: false hasContentIssue false
  • English
  • Français

Reversible Phase Transformations during In-Situ Heating of Uncapped Ge2Sb2Te5 Films

Published online by Cambridge University Press:  30 July 2021

Chanchal Ghosh ,
Manish Singh ,
Paul Kotula ,
Helena Silva  and
C. Barry Carter
Chanchal Ghosh
Affiliation:
University of Connecticut, Connecticut, United States
Manish Singh
Affiliation:
University of Connecticut, Connecticut, United States
Paul Kotula
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico, United States
Helena Silva
Affiliation:
University of Connecticut, Connecticut, United States
C. Barry Carter
Affiliation:
University of Connecticut, Connecticut, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2412 - 2414
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Andersson, J.-O., Helander, T., Höglund, L., Shi, P. & Sundman, B. (2002). Thermo-Calc & DICTRA, computational tools for materials science. Calphad 26(2), 273-312.Google Scholar
Carter, C.B. & Williams, D.B. (2016). Transmission electron microscopy: Diffraction, imaging, and spectrometry. Springer.Google Scholar
Friedrich, I., Weidenhof, V., Njoroge, W., Franz, P. & Wuttig, M. (2000). Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements. J Appl Phys 87(9), 4130-4134.CrossRefGoogle Scholar
Ghosh, C., Singh, M.K., Watt, J., Silva, H. & Carter, C.B. (2020). Defect Imaging and Structure Evolution in GST Films During In-situ Heating. Microsc Microanal 26(S2), 1396-1398.CrossRefGoogle Scholar
Kooi, B., Groot, W. & De Hosson, J.T.M. (2004). In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5. J Appl Phys 95(3), 924-932.Google Scholar
Singh, M.K., Ghosh, C., Kotula, P., Watt, J., Silva, H. & Carter, C.B. (2020a). Direct Observation of Phase Transformations in Ge-Sb-Te Materials. Microsc Microanal 26(S2), 1418-1420.CrossRefGoogle Scholar
Singh, M.K., Ghosh, C., Miller, B., Kotula, P.G., Tripathi, S., Watt, J., Bakan, G., Silva, H. & Carter, C.B. (2020b). In situ TEM study of crystallization and chemical changes in an oxidized uncapped Ge2Sb2Te5 film. J Appl Phys 128(12), 124505.CrossRefGoogle Scholar
Tripathi, S., Kotula, P., Singh, M.K., Ghosh, C., Bakan, G., Silva, H. & Carter, C.B. (2020). Role of Oxygen on Chemical Segregation in Uncapped Ge2Sb2Te5 Thin Films on Silicon Nitride. ECS J Solid State Sc 9(5), 054007.Google Scholar
Williams, D.B. & Carter, C.B. (2009). Transmission electron microscopy: a textbook for materials science. Springer.Google Scholar
Wuttig, M. & Yamada, N. (2007). Phase-change materials for rewriteable data storage. Nature materials 6(11), 824-832.CrossRefGoogle ScholarPubMed