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Sample Thickness Limitations in Defocused Electron Probe Ptychography

Published online by Cambridge University Press:  01 August 2018

Arthur M. Blackburn
Affiliation:
University of Victoria, Centre for Advanced Materials and Related Technology, Victoria BC, Canada
Adriaan Frencken
Affiliation:
University of Victoria, Department of Chemistry, Victoria BC, Canada

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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