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Seamless Communication Between High-Performance Computing System and Electron Microscopes for On-Demand Automated Data Transfer and Remote Control

Published online by Cambridge University Press:  22 July 2022

Debangshu Mukherjee*
Affiliation:
Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Anees Al-Najjar
Affiliation:
Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Kevin M. Roccapriore
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Jacob D. Hinkle
Affiliation:
Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Andrew R. Lupini
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Chris Meyer
Affiliation:
NION R&D, Kirkland, WA, United States
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Olga S. Ovchinnikova
Affiliation:
Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Nageswara S. Rao
Affiliation:
Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
*
*Corresponding author: mukherjeed@ornl.gov

Abstract

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Type
Microscopy Infrastructures: Architectures, Avenues and Access
Copyright
Copyright © Microscopy Society of America 2022

References

Brown, LM in “Electron Microscopy and Analysis 1997” (CRC Press, 1997) p. 17. DOI: 10.1201/9781003063056-4Google Scholar
Ophus, C, Microscopy and Microanalysis 25 (2019) p. 563. DOI: 10.1017/S143192761900049710.1017/S1431927619000497CrossRefGoogle Scholar
Hage, FS et al. , Science Advances 4 (2018), p. eaar7495. DOI: 10.1126/sciadv.aar749510.1126/sciadv.aar7495CrossRefGoogle Scholar
Spurgeon, SR et al. , Nature Materials 20 (2021), p. 274. DOI: 10.1038/s41563-020-00833-z10.1038/s41563-020-00833-zCrossRefGoogle Scholar
Ercius, P et al. , Microscopy and Microanalysis 26 (2020), p. 1896. DOI: 10.1017/S143192762001975310.1017/S1431927620019753CrossRefGoogle Scholar
Roccapriore, KM et al. , arXiv:2112.04479 (2021).10.5465/AMBPP.2021.10280abstractCrossRefGoogle Scholar
Meyer, C et al. , Microscopy and Microanalysis 25 (2019), p.122. DOI: 10.1017/S143192761900134X10.1017/S143192761900134XCrossRefGoogle Scholar
Research is supported by ORNL's Laboratory Directed Research and Development Program (INTERSECT Initiative), managed by UT-Battelle, LLC for the U.S. Department of Energy (DOE). Electron microscopy was conducted as part of a user proposal at Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. DOE Office of Science User Facility. This manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan)Google Scholar