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Simulating Thermal Noise for S/TEM Images from Atom Coordinate Data

Published online by Cambridge University Press:  05 August 2019

Joseph Tessmer  and
Marc De Graef
Joseph Tessmer
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh, PA, USA.
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh, PA, USA.

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 210 - 211
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]De Graef, Marc. Intro. to conventional transmission electron microscopy. Cambridge University Press, 2003.Google Scholar
[2]Loane, Russel F., Xu, PeiRong, and Silcox, John. Acta Crystallographica Section A: Foundations of Crystallography 47.3 (1991): 267-278.Google Scholar
[3]Tessmer, Joseph, Singh, Saransh, and De Graef, Marc. Microscopy and Microanalysis 24.S1 (2018), p. 208.Google Scholar
[4]Peng, L-M., et al. Acta Crys-tallographica Section A: Foundations of Crystallography 52.3 (1996), p. 456.Google Scholar
[5]The authors acknowledge an ONR Vannevar Bush Faculty Fellowship (N00014-16-1-2821), and the compu-tational resources of the Materials Characterization Facility at CMU, grant MCF-677785.Google Scholar