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STEM EBIC to Study 2D Materials

Published online by Cambridge University Press:  27 August 2014

E. R. White ,
Alex Kerelsky ,
Grant Jasmin ,
William A. Hubbard ,
Matthew Mecklenburg  and
B. C. Regan
E. R. White
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Alex Kerelsky
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Grant Jasmin
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
William A. Hubbard
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, California 90089USA
B. C. Regan
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 172 - 173
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Butz, B, et al, Nature 505 (2014) p. 533.Google Scholar
[2] Leamy, H, Appl, J. Phys. 53 (1982) p. R51.Google Scholar
[3] Bunker, K, et al, Mat. Res. Soc. Symp. Proc. 743 (2003) p L10.10.1.Google Scholar
[4] This work is supported by STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by NSF DMR award 1206849, and the Electron Imaging Center for NanoMachines at UCLA.Google Scholar