Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-06-02T12:18:33.777Z Has data issue: false hasContentIssue false
  • English
  • Français

STEM in 4 Dimensions: Using Multivariate Analysis of Ptychographic Data to Reveal Material Functionality

Published online by Cambridge University Press:  23 September 2015

Stephen Jesse ,
Miaofang Chi ,
Albina Y. Borisevich ,
Alex Belianinov ,
Raymond R. Unocic ,
Christopher T. Symons ,
Eirik Endeve ,
Richard K. Archibald ,
Sergei V. Kalinin  and
Andrew R. Lupini
Christopher T. Symons
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Eirik Endeve
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Richard K. Archibald
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Sergei V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Andrew R. Lupini
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1863 - 1864
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Rodenburg, J. M., McCallum, B. C. & Nellist, P. D., Ultramicroscopy 48 (1993) 304.CrossRefGoogle Scholar
[2] Shibata, N., et al, Nature Physics 8 (2012) 611.Google Scholar
[3] Pennycook, T.J., et al, Ultramicroscopy (in press, (available on-line Nov. 2014.Google Scholar
[4] Ophus, C., et al, Microsc. Microanal. 20, 2014.CrossRefGoogle Scholar
[5] The authors would like to acknowledge Liang Jin and Benjamin Bammes for their assistance in allowing us to use the DE-12 system. <underline>http://www.directelectron.com/</underline>.http://www.directelectron.com/.>Google Scholar
[6] Research supported by: Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy, by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U. S. Department of Energy, and by Division of Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. DOE. This study used the resources of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, and analysis under support of applied mathematics program at the DOE..Google Scholar