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Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design

Published online by Cambridge University Press:  23 September 2015

Lewys Jones ,
Katherine E. MacArthur ,
Jolyon Aarons ,
Chris-Kriton Skylaris ,
Misbah Sarwar ,
Dogan Ozkaya  and
Peter D. Nellist
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
Katherine E. MacArthur
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
Jolyon Aarons
Affiliation:
School of Chemistry, University of Southampton, Southampton, UK.
Chris-Kriton Skylaris
Affiliation:
School of Chemistry, University of Southampton, Southampton, UK.
Misbah Sarwar
Affiliation:
Johnson Matthey, Reading, UK.
Dogan Ozkaya
Affiliation:
Johnson Matthey, Reading, UK.
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford UK.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2197 - 2198
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lebeau, J. M. and Stemmer, S., Ultramicroscopy 108 (2008). p. 1653–1658.Google Scholar
[2] S. Van Aert et at Nature 470 (2011). p. 374–377.Google Scholar
[3] Jones, L. et al., Nano Lett. 14 (2014).p. 6336–6341.Google Scholar
[4] The authors acknowledge funding from EU FP7 grant 312483 (ESTEEM2), EPSRC grant EP/K040375/1 and Johnson Matthey, and S. VanAert and A. DeBacker for their useful discussions..Google Scholar