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Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector

Published online by Cambridge University Press:  30 July 2020

Matus Krajnak ,
Jean-Denis Blazit ,
Alexander Zintler ,
Robert Eilhardt ,
Jon Weiss ,
Doug Cosart ,
Leopoldo Molina-Luna ,
Marcel Tencé ,
Alexandre Gloter  and
Christopher Allen
...Show all authors
Matus Krajnak
Affiliation:
Quanum Detectors Ltd., Harwell Oxford, England, United Kingdom
Jean-Denis Blazit
Affiliation:
Université Paris-Saclay, CNRS, Orsay, Ile-de-France, France
Alexander Zintler
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Robert Eilhardt
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Jon Weiss
Affiliation:
NanoMEGAS USA, Tempe, Arizona, United States
Doug Cosart
Affiliation:
NanoMEGAS USA, Tempe, Arizona, United States
Leopoldo Molina-Luna
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Marcel Tencé
Affiliation:
Université Paris-Saclay, CNRS, Orsay, Ile-de-France, France
Alexandre Gloter
Affiliation:
Université Paris-Saclay, CNRS, Orsay, Ile-de-France, France
Christopher Allen
Affiliation:
Electron Physical Science Imaging Centre, Diamond Light Source, Didcot, England, United Kingdom
Damien McGrouther
Affiliation:
University of Glasgow, UK, Glasgow, Scotland, United Kingdom

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1944 - 1945
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Copyright
Copyright © Microscopy Society of America 2020

References

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