No CrossRef data available.
Article contents
Uncovering the Mechanism for Electron-beam Manipulation of Dopants in Silicon
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927620022035/resource/name/firstPage-S1431927620022035a.jpg)
- Type
- Advances in Microscopy for Quantum Information Sciences - Single Atom
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Susi, T. et al. ., Ultramicroscopy 180 (2017) 16310.1016/j.ultramic.2017.03.005CrossRefGoogle Scholar
Susi, T. et al. ., Physical Review Letters 113 (2014) 11550110.1103/PhysRevLett.113.115501CrossRefGoogle Scholar
Tripathi, M. et al. ., Nano Letters 18 (2018) 531910.1021/acs.nanolett.8b02406CrossRefGoogle Scholar
Susi, T., Meyer, J.C., Kotakoski, J., Nature Reviews Physics 1 (2019) 39710.1038/s42254-019-0058-yCrossRefGoogle Scholar