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Use of spectrum simulation to optimise collection parameters for accurate and efficient WDS and EDS quantitative analyses

Published online by Cambridge University Press:  30 July 2021

Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Rosie Jones
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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