Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-15T01:27:47.207Z Has data issue: false hasContentIssue false
  • English
  • Français

Using Deep Learning to Deconvolute Complex Spectra for Hyperspectral Imaging Applications

Published online by Cambridge University Press:  05 August 2019

Samantha Rudinsky ,
Yu Yuan ,
Francis B. Lavoie ,
Raynald Gauvin ,
Ryan Gosselin ,
Nadi Braidy ,
Nicolas Piché  and
Mike Marsh
Samantha Rudinsky
Affiliation:
Department of Materials Engineering, McGill University. Montreal, Canada.
Yu Yuan
Affiliation:
Department of Materials Engineering, McGill University. Montreal, Canada.
Francis B. Lavoie
Affiliation:
Department of Chemical Engineering and Biotechnological Engineering, Université de Sherbrooke. Sherbrooke, Canada.
Raynald Gauvin
Affiliation:
Department of Materials Engineering, McGill University. Montreal, Canada.
Ryan Gosselin
Affiliation:
Department of Chemical Engineering and Biotechnological Engineering, Université de Sherbrooke. Sherbrooke, Canada.
Nadi Braidy
Affiliation:
Department of Chemical Engineering and Biotechnological Engineering, Université de Sherbrooke. Sherbrooke, Canada.
Nicolas Piché
Affiliation:
Object Research Systems. Montreal, Canada.
Mike Marsh
Affiliation:
Object Research Systems. Denver, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 178 - 179
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Kotula, P.G., et al. , Microscopy and Microanalysis 9 (2003), p. 1-17.Google Scholar
[2]Piché, N., et al. , Microscopy and Microanalysis 24 (Suppl 1) (2018), p. 560-561.Google Scholar
[3]Gauvin, R., et al. , Microscopy and Microanalysis 15 (Suppl 2) (2009), p. 488-489.Google Scholar