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Utilizing Atom Probe Tomography for 3-D Quantification of Point Defects

Published online by Cambridge University Press:  04 August 2017

Brian P. Gorman ,
George Burton  and
David R. Diercks
Brian P. Gorman
Affiliation:
Colorado Center for Advanced Ceramics, Colorado School of Mines, Golden, CO, USA
George Burton
Affiliation:
Colorado Center for Advanced Ceramics, Colorado School of Mines, Golden, CO, USA
David R. Diercks
Affiliation:
Colorado Center for Advanced Ceramics, Colorado School of Mines, Golden, CO, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1574 - 1575
Copyright
© Microscopy Society of America 2017 

References

[1] Diercks, D. R., et.al, Journal of Materials Chemistry A 4 2016). p. 5167.Google Scholar
[2] Clark, D. R., et.al, Nanoletters 16 2016). p. 6924.Google Scholar
[3] Kirchhofer, R., et.al, Journal of the American Ceramic Society 97 2014). p. 2677.Google Scholar
[4] Stokes, A., et.al, Acta Materiala 102 2016). p. 32.Google Scholar