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A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

Published online by Cambridge University Press:  05 August 2019

Benjamin W. Caplins ,
Ryan M. White ,
Jason D. Holm  and
Robert R. Keller
Benjamin W. Caplins*
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
Ryan M. White
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
Jason D. Holm
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
Robert R. Keller
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
*
*Corresponding author: benjamin.caplins@nist.gov

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 218 - 219
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Lenthe, W.C. et al. , Ultramicroscopy 195 (2018), p. 93.Google Scholar
[2]Egerton, R.F., Micron 119 (2019), p. 72.Google Scholar
[3]Gulde, M. et al. , Science 345 (2014), p. 200.Google Scholar
[4]Han, Y. et al. , Nano Letters 18 (2018), p. 3746.Google Scholar
[5]This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar