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Injection and Interface-Dominated Nonlinear Resistors from Tin-Carbon Nanotube Junctions

Published online by Cambridge University Press:  02 January 2019

Toshiyuki Sato ,
Yoshitaka Kamata ,
Jian Song ,
Hui Li ,
Jiyuan Huang ,
Howard E. Katz Open the ORCID record for Howard E. Katz [Opens in a new window]  and
Paul Czubarow
Toshiyuki Sato
Affiliation:
NAMICS Corporation, NTC, 3993 Nigorikawa, Kita-ku, Niigata-City, Japan 950-3131
Yoshitaka Kamata
Affiliation:
NAMICS Corporation, NTC, 3993 Nigorikawa, Kita-ku, Niigata-City, Japan 950-3131
Jian Song
Affiliation:
Johns Hopkins University, Department of Materials Science and Engineering, 3400 North Charles Street, Baltimore, MD 21218
Hui Li
Affiliation:
Johns Hopkins University, Department of Materials Science and Engineering, 3400 North Charles Street, Baltimore, MD 21218
Jiyuan Huang
Affiliation:
Johns Hopkins University, Department of Materials Science and Engineering, 3400 North Charles Street, Baltimore, MD 21218
Howard E. Katz*
Affiliation:
Johns Hopkins University, Department of Materials Science and Engineering, 3400 North Charles Street, Baltimore, MD 21218
Paul Czubarow
Affiliation:
eM-TECH Inc., 200 Turnpike Rd. Suite 3, Southborough, MA 01772
*
*(Email: hekatz@jhu.edu)
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Abstract:

This manuscript describes low-voltage epoxy-carbon nanotube composites with highly nonlinear resistances. Carbon nanotube paste was deposited on interdigitated electrodes and I-V characteristics were obtained over different voltage ranges and at different sweep speeds. In most cases, the injection process into the electrode-composite interface region was dominant, with exponential voltage dependence of the current.

Keywords

compositeelectronic materialnanostructurepolymer
Type
Articles
Information
MRS Advances , Volume 4 , Issue 3-4: Nanomaterials , 2019 , pp. 185 - 189
Copyright
Copyright © Materials Research Society 2018 

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References

References:

Boni, A., Tonelli, M., Magnanini, A. and Caselli, M., Electronics Letters 51 (17), 1316–1317 (2015).CrossRefGoogle Scholar
Lee, J., Huh, Y., Bendix, P. and Kang, S. M., IEEE Journal of Solid-State Circuits 39 (1), 260–264 (2004).CrossRefGoogle Scholar
Nayak, P., Pramanick, S. K. and Rajashekara, K., IEEE Transactions on Industrial Electronics 65 (3), 1955–1964 (2018).CrossRefGoogle Scholar
Nespurek, S., Czechoslovak Journal of Physics B 24 (6), 660–670 (1974).CrossRefGoogle Scholar
Joung, D., Chunder, A., Zhai, L. and Khondaker, S. I., Applied Physics Letters 97 (9) (2010).CrossRefGoogle Scholar