Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-10-31T22:49:55.540Z Has data issue: false hasContentIssue false

Aromatic Polythiourea with Ultrahigh Breakdown Strength for High Energy Density and Low Loss Capacitor Applications

Published online by Cambridge University Press:  22 March 2013

Shan Wu
Affiliation:
Department of Electrical Engineering and the Materials Research Institute The Pennsylvania State University, University Park, PA 16802, USA
Quinn Burlingame
Affiliation:
Department of Electrical Engineering and the Materials Research Institute The Pennsylvania State University, University Park, PA 16802, USA
Weiping Li
Affiliation:
Department of Electrical Engineering and the Materials Research Institute The Pennsylvania State University, University Park, PA 16802, USA
Minren Lin
Affiliation:
Department of Electrical Engineering and the Materials Research Institute The Pennsylvania State University, University Park, PA 16802, USA
Yue Zhou
Affiliation:
Department of Electrical Engineering and the Materials Research Institute The Pennsylvania State University, University Park, PA 16802, USA
Qin Chen
Affiliation:
GE Global Research Center Niskayuna, NY 12309, USA
Andrew Payzant
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge, TN 37831, USA
Kai Xiao
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge, TN 37831, USA
Qiming Zhang
Affiliation:
Department of Electrical Engineering and the Materials Research Institute The Pennsylvania State University, University Park, PA 16802, USA
Get access

Abstract

Dielectric capacitors for energy storage are of great importance in modern electronics and electric systems. It is a challenge to realize the high energy density while maintain the low dielectric loss. We investigated an ultra high breakdown electric field of 1.1 GV/m, which is approaching the intrinsic breakdown, in aromatic polythiourea, a new dielectric material that serves a high energy density of 23 J/cm3 as well as high charge-discharge efficiency above 90%. The molecular structure and film surface morphology were also studied, it was proved a polar amorphous phase and glass state material could significantly suppress the high field conduction to several orders smaller compared with regular polymer dielectric materials, which are usually semi-crystalline and in rubber phase.

Type
Articles
Copyright
Copyright © Materials Research Society 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Sarjeant, W.J., Zirnheld, J., MacDougall, F.W., IEEE Trans. Plasma Sci. 26 (1998) 1368.CrossRefGoogle Scholar
Cao, Y., Irwin, P.C., Younsi, K., Dielectrics and Electrical Insulation, IEEE Transactions on 11 (2004) 797.Google Scholar
Rabuffi, M., Picci, G., IEEE Trans. Plasma Sci. 30 (2002) 1939.CrossRefGoogle Scholar
Chen, Q., Wang, Y., Zhou, X., Zhang, Q.M., Zhang, S., Appl. Phys. Lett. 92 (2008) 142909.CrossRefGoogle Scholar
Zhou, X., Chen, Q., Zhang, Q.M., Zhang, S., Dielectrics and Electrical Insulation, IEEE Transactions on 18 (2011) 463.CrossRefGoogle Scholar
Li, J., Seok, S.I., Chu, B., Dogan, F., Zhang, Q., Wang, Q., Adv. Mater. 21 (2009) 217.CrossRefGoogle Scholar
Zhou, X., Chu, B., Neese, B., Lin, M., Zhang, Q.M., Dielectrics and Electrical Insulation, IEEE Transactions on 14 (2007) 1133.CrossRefGoogle Scholar
Wu, S., Lin, M., Lu, S.G., Zhu, L., Zhang, Q.M., Appl. Phys. Lett. 99 (2011) 132901.CrossRefGoogle Scholar
Nalwa, H.N.S., Ferroelectric Polymers, CRC PressI Llc, 1995.CrossRefGoogle Scholar
Chu, B., Zhou, X., Ren, K., Neese, B., Lin, M., Wang, Q., Bauer, F., Zhang, Q., Science 313 (2006) 334336.CrossRefGoogle Scholar
Banihashemi, A., Hazarkhani, H., Abdolmaleki, A., Journal of Polymer Science Part a: Polymer Chemistry 42 (2004) 2106.CrossRefGoogle Scholar
Sinha, J.K., Journal of Scientific Instruments 42 (1965) 696.CrossRefGoogle Scholar
Levy-Leblond, J.M., Provost, J.P., Physics Letters B 26 (1967) 104.CrossRefGoogle Scholar
Ugalde, J.M., Sarasola, C., Physical Review A 54 (1996) 2868.CrossRefGoogle Scholar
Wu, S., Li, W., Lin, M., Burlingame, Q., Chen, Q., Payzant, A., Xiao, K., and Zhang, Q. M., Adv. Mater. (2013). doi: 10.1002/adma.201204072 Google Scholar