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Electrical Hysteresis of PEDOT/PSS-Metal Contact Devices

Published online by Cambridge University Press:  17 March 2011

Zhengchun Liu ,
Yi Su  and
Kody Varahramyan
Zhengchun Liu
Affiliation:
Institute for Micromanufacturing Louisiana Tech University Ruston, LA, 71272, U.S.A
Yi Su
Affiliation:
Institute for Micromanufacturing Louisiana Tech University Ruston, LA, 71272, U.S.Ayisu@latech.edu
Kody Varahramyan
Affiliation:
Institute for Micromanufacturing Louisiana Tech University Ruston, LA, 71272, U.S.A
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Abstract

PEDOT/PSS is an air-stable and solution-processable semiconductor polymer with great potential for electronic applications. In this research, we investigated the PEDOT/PSS-metal contacts using Al-PEDOT/PSS-Au as a test device. Abnormal electrical hysteresis phenomena were observed in both the current-voltage and capacitance-voltage characteristics of the device. A model in terms of metal-polymer interfacial MIS structure and ion motion in the polymer is proposed for explanation of the ‘hysteresis’ phenomena.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 814: Symposium I – Flexible Electronics 2004-Materials and Device Technology , 2004 , I10.8
Copyright
Copyright © Materials Research Society 2004

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References

1. Turut, A. and Koleli, F., Journal of Applied Physics, 72, 818–819 (1992).Google Scholar
2. Liang, G., Cui, T., and Varahramyan, K., Solid State Electronics, 47, 691–694 (2003).Google Scholar
3. Huang, C. C., Meng, H. F., and Ho, G. K. et al. , Applied Physics Letters, 84, 1195–1197 (2004).Google Scholar
4. Shaheen, S. E., Radspinner, R., and Peyghambarian, N. et al, Applied Physics Letters, 79, 2996–2998 (2001).Google Scholar
5. Lu, J., Pinto, N. J., and MacDiarmid, A.G., Journal of Applied Physics, 92, 6033–6037 (2002).Google Scholar
6. Koch, N., Nickel, B., and Ghijsen, J. et al, Materials Research Society Symposium - Proceedings, 771, 35–40 (2003).Google Scholar
7. Bantikassegn, W. and Inganas, O., Thin Solid Films, 293, 138–143 (1997).Google Scholar
8. Bantikassegn, W. and Inganas, O., J. Phys. D: Appl. Phys., 29, 2971–2975 (1996).Google Scholar