Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-06-03T06:03:45.051Z Has data issue: false hasContentIssue false
  • English
  • Français

Geometric Phase Analysis of Nano-Scale Strain Fields Around 90° Domains in PbTiO3/SrTiO3 Epitaxial Thin Film

Published online by Cambridge University Press:  31 January 2011

Takanori Kiguchi ,
Kenta Aoyagi ,
Toyohiko J. Konno ,
Satoru Utsugi ,
Tomoaki Yamada  and
Hiroshi Funakubo
Takanori Kiguchi
Affiliation:
tkiguchi@imr.tohoku.ac.jp, Tohoku University, Institute for Materials Research, Sendai, Japan
Kenta Aoyagi
Affiliation:
k-aoyagi@imr.tohoku.ac.jp, Tohoku University, Department of Materials Science, Sendai, Japan
Toyohiko J. Konno
Affiliation:
tjkonno@imr.tohoku.ac.jp, Tohoku University, Institute for Materials Research, Sendai, Miyagi, Japan
Satoru Utsugi
Affiliation:
utsugi.s.aa@m.titech.ac.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Yokohama, Kanagawa, Japan
Tomoaki Yamada
Affiliation:
yamada.t.al@m.titech.ac.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Yokohama, Kanagawa, Japan
Hiroshi Funakubo
Affiliation:
funakubo@mte.biglobe.ne.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Yokohama, Kanagawa, Japan
Get access

Abstract

The nano-scale strain fields analysis around 90° domains and misfit dislocations in PbTiO3/SrTiO3 001 epitaxial thin film has been conducted using the geometric phase analysis (GPA) combined with high angle annular dark field - scanning transmission electron microscopy (HAADF-STEM). The films typically possess a-c mixed domain configuration with misfit dislocations. The PbTiO3 layer was formed from the two layer: the upper 200 nm layer shows the typical a- and c- mixed domain configuration where the a-domains are several tens nm in width; the bottom 100 nm layer shows the different domain configuration that the width is several nm. In the latter case, a-domains are terminated within the film and are short in length. On the other hand, the bottom of a-domains does not contact the film/substrate interface. It keeps away from the interface, and there is completely c-domain layer under a-domains. The HAADF-STEM-GPA shows that the strain fields around an a-domain and a misfit dislocation interact each other: the tensile strain field and lattice plane bending fit together. This result indicates that the a-domain originates from the misfit dislocation.

Keywords

ferroelectricthin filmnanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1199: Symposium F –Multiferroic and Ferroelectric Materials , 2009 , 1199-F09-08
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Emelyanov, A. Yu. and Pertsev, N. A., Phys. Rev. B 68, 214103 (2003).Google Scholar
2 Ide, Takashi, Sakai, Akira, and Shimizu, Keiji, Thin Solid Films, 357, 22 (1999)Google Scholar
3 Robertson, M.D., Currie, J.E., Corbett, J.M., and Webb, J.B., Ultramicroscopy, 58, 175 (1998).Google Scholar
4 Hÿtch, M.J., Snoeck, E., and Kilaas, R., Ultramicroscopy, 74, 131 (1998).Google Scholar
5 Nagashima, K., Aratani, M., and Funakubo, H., Jpn. J. Appl. Phys. Part 2, 39, L996 (2000).Google Scholar
6 Nagashima, K. and Funakubo, H., Jpn. J. Appl. Phys. Part 1, 39, 212 (2000).Google Scholar
7 Theis, C.D. and Schlom, D.G., J. Mater. Res. 12, 1297 (1997)Google Scholar
8 GAO, Y., BAI, G., MERKLE, K.L., CHANG, H.L.M., LAM, D.J., Thin Solid Films, 235, 86 (1993).Google Scholar
9 Stemmer, S., Streiffer, S. K., Ernst, F., Rühle, M., phys. stat. sol. (a) 147, 135 (1995).Google Scholar
10 Hu, S. Y., Li, Y. L., and Chen, L. Q., J. Appl. Phys. 94, 2542 (2003).Google Scholar