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High Resolution Electron Microscopy Studies On The Microstructure Of β-Si3N4w/Al Interfaces In A β-Si3N4w/6061Al Composite

Published online by Cambridge University Press:  25 February 2011

X. G. Ning ,
J. Pan ,
K. Y. Hu  and
H. Q. Ye
X. G. Ning
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, P.R., China
J. Pan
Affiliation:
Changsha Institute of Technology, Changsha 410073, P.R., China
K. Y. Hu
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, P.R., China
H. Q. Ye
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, P.R., China
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Abstract

The whisker/matrix interfaces in a β-Si3N4w/60 61Al composite were structurally characterized by high resolution transmission electron microscopy (HRTEM). It was shown that there was a nearly amorphous layer (2–3 nm thickness) at a whisker/matrix interface. The magnesium segregation at the whisker/Al interface was revealed by electron dispersive analysis of x-ray (EDAX). MgO and MgAl2O4 nanocrystal particles were formed at the whisker/matrix interface due to the Mg segregation there during the manufacturing of the composite. The Mg2Si particles preferred to precipitate at the whisker/Al interface when the composite was processed with T6 heating treatment. There were specific orientation relationship of the MgAl2O4 or Mg2Si particles with the β-Si3N4 whiskers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 238: Symposium Cb – Structure and Properties of Interfaces in Materials , 1991 , 865
Copyright
Copyright © Materials Research Society 1992

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References

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