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Highly Efficient Microcrystalline Silicon Solar Cells Deposited from a Pure SiH4 Flow

Published online by Cambridge University Press:  01 February 2011

Menno van den Donker
Affiliation:
M.v.d.Donker@fz-juelich.de, Forschungszentrum Juelich GmbH, Insitute of Photovoltaics, Leo.Brandtstrasse 2, Juelich, N/A, 52425, Germany, 00492461614855, 00492461613735
B. Rech
Affiliation:
B.Rech@fz-juelich.de, Forschungszentrum Juelich GmbH, IPV, Juelich, N/A, 52425, Germany
R. Schmitz
Affiliation:
r.schmitz@fz-juelich.de, Forschungszentrum Juelich GmbH, IPV, Juelich, N/A, 52425, Germany
J. Klomfass
Affiliation:
J.Klomfass@fz-juelich.de, Forschungszentrum Juelich GmbH, IPV, Juelich, N/A, 52425, Germany
G. Dingemans
Affiliation:
g.dingemans@fz-juelich.de, Forschungszentrum Juelich GmbH, IPV, Juelich, N/A, 52425, Germany
F. Finger
Affiliation:
f.finger@fz-juelich.de, Forschungszentrum Juelich GmbH, IPV, Juelich, N/A, 52425, Germany
L. Houben
Affiliation:
l.houben@fz-juelich.de, Forschungszentrum Juelich GmbH, IFF, Juelich, N/A, 52425, Germany
W.M.M. Kessels
Affiliation:
W.M.M.Kessels@tue.nl, TU Eindhoven, Applied Physics, PO Box 513, Eindhoven, N/A, 5600MB, Netherlands
M.C.M. van de Sanden
Affiliation:
M.C.M.v.d.Sanden@tue.nl, TU Eindhoven, Applied Physics, PO Box 513, Eindhoven, N/A, 5600MB, Netherlands
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Abstract

The effect of conventional process parameters on the deposition of μc-Si:H solar cells is reviewed. Then, an approach to solar cell optimization is presented in which hidden, internal parameters are adjusted rather than conventional, external process parameters. The investigation focuses on deposition at low H2 dilution ratio and low total gas flow. A hidden parameter is identified through time resolved optical emission spectroscopy on SiH emission: Transient depletion of the SiH4 source gas leads to uncontrolled deposition conditions during the first 90 s after plasma ignition. There hardly is any effect on plasma properties and deposited film properties for the remainder of deposition after the transient depletion phase. As demonstrator a 9.5 % efficient single junction μc-Si:H solar cell was deposited from a pure SiH4 flow. A reinterpretation of the role of H2 dilution is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

1 Yamamoto, K., Yoshimi, M., Tawada, Y., Fukuda, S., Sawada, T., Meguro, T., Takata, H., Suezaki, T., Koi, Y., Hayashi, K., Suzuki, T., Ichikawa, M., and Nakajima, A., Sol. Energy Mater. Sol. Cells 74, 449 (2002).Google Scholar
2 Rech, B., Repmann, T., Donker, M.N. van den, Berginski, M., Kilper, T., Hüpkes, J., Calnan, S., Stiebig, H., and Wieder, S., Thin Solid Films, in press, doi: 10.1016/j.tsf.2005.12.161Google Scholar
3 Smit, C., Hamers, E.A.G., Korevaar, B.A., Swaaij, R.A.C.M.M. van, and Sanden, M.C.M. van de, J. Non-Cryst. Sol. 299–302, 98 (2002).Google Scholar
4 Kosku, N., Kurisu, F., Takegoshi, M., Takahashi, H., and Miyazaki, S., Thin Solid Films 435, 39 (2003).Google Scholar
5 Shirai, H., Arai, T., and Ueyama, H., Jpn. J. Appl. Phys. 37, L1078 (1998)Google Scholar
6 Vetterl, O., Finger, F., Carius, R., Hapke, P., Houben, L., Kluth, O., Lambertz, A., Mück, A., Rech, B., and Wagner, H., Sol. Energy Mat. Sol. Cells 62, 97 (2000).Google Scholar
7 Houben, L., Luysberg, M., Hapke, P., Carius, R., Finger, F., and Wagner, H., Phil. Mag. A 77, 1447 (1998).Google Scholar
8 Mai, Y., Klein, S., Carius, R., Wolff, J., Lambertz, A., Finger, F., and Geng, X., J. Appl. Phys. 97, 114913 (2005).Google Scholar
9 Rech, B., Roschek, T., Repmann, T., Müller, J., Schmitz, R., and Appenzeller, W., Thin Solid Films 427, 157 (2003).Google Scholar
10 Kondo, M., Fukawa, M., Guo, L., and Matsuda, A., J. Non-Cryst. Sol. 266–269, 84 (2000).Google Scholar
11 Roschek, T., Rech, B., Müller, J., Schmitz, R., and Wagner, H., Thin Solid Films 451–452, 466 (2004).Google Scholar
12 Roschek, T., Repmann, T., Müller, J., Rech, B., and Wagner, H., J. Vac. Sci. Technol. A 20, 492 (2002).Google Scholar
13 Lisovskiy, V.A. and Yegorenkov, V.D., J. Phys. D: Appl. Phys. 31, 3349 (1998).Google Scholar
14 Sansonnens, L., Pletzer, A., Magni, D., Howling, A.A., Hollenstein, Ch., and Schmitt, J.P.M., Plasma Sources Sci. Technol. 6, 170 (1997).Google Scholar
15 Donker, M.N. van den, Schmitz, R., Appenzeller, W., Rech, B., Kessels, W.M.M, and Sanden, M.C.M. van de, Thin Solid Films, in press, doi:10.1016/j.tsf.2005.12.167Google Scholar
16 Feitknecht, L., Meier, J., Torres, P., Zürcher, J., and Shah, A., Sol. Energy Mat. Sol. Cells 74, 539 (2002).Google Scholar
17 Donker, M.N. van den, Rech, B., Finger, F., Kessels, W.M.M., and Sanden, M.C.M. van de, Appl. Phys. Lett. 87, 263503 (2005).Google Scholar
18 Kluth, O., Rech, B., Houben, L., Wieder, S., Schöpe, G., Beneking, C., Wagner, H., Löffl, A., and Schock, H.W., Thin Solid Films 351, 247 (1999).Google Scholar
19 Kluth, O., Schöpe, G., Hüpkes, J., Agashe, C., Müller, J., and Rech, B., Thin Solid Films 442, 80 (2003).Google Scholar
20 Luque, J. and Crosley, D.R., “LIFBASE: Database and Spectral Simulation Program (Version 1.5)”, SRI International Report MP 99-009 (1999). http://www.sri.com/psd/lifbaseGoogle Scholar
21 Perrin, J. and Delafosse, E., J. Phys. D: Appl. Phys. 13, 759 (1980).Google Scholar