Hostname: page-component-848d4c4894-nr4z6 Total loading time: 0 Render date: 2024-06-12T11:02:13.719Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging of Ferroelectric Domains in KTiOPO4 Single Crystals by Synchrotron X-RAY Topography

Published online by Cambridge University Press:  21 February 2011

S. Wang ,
M. Dudley ,
L.K. Cheng ,
J.D. Bierlein  and
W. Bindloss
S. Wang
Affiliation:
Dept. of Materials Science and Engineering, SUNY at Stony Brook, NY 11794-2275
M. Dudley
Affiliation:
Dept. of Materials Science and Engineering, SUNY at Stony Brook, NY 11794-2275
L.K. Cheng
Affiliation:
E.I. du Pont de Nemours & Company, Inc., Experimental Station, Central R&D Dept., P.O. Box 80306, Wilmington, DE 19880-0306
J.D. Bierlein
Affiliation:
E.I. du Pont de Nemours & Company, Inc., Experimental Station, Central R&D Dept., P.O. Box 80306, Wilmington, DE 19880-0306
W. Bindloss
Affiliation:
E.I. du Pont de Nemours & Company, Inc., Experimental Station, Central R&D Dept., P.O. Box 80306, Wilmington, DE 19880-0306
Get access

Abstract

The application of synchrotron white beam X-ray topography to the study of ferroelectric domain structures in hydrothermally grown potassium titanyl phosphate (KTiOPO4: KTP) single crystals is reported. The domain walls can be exclusively imaged on topographs with selected diffraction vectors and X-ray wavelengths, while images of other defects, such as dislocations, inclusions and surface scratches, can be simultaneously made very diffuse. The topographic images correspond well with electrostatic toning images. X-ray topography readily reveals the three dimensional shapes of the domain walls. There are two contributions to domain wall contrast: one is fringe-like which can be interpreted in terms of the dynamical theory of X-ray diffraction, and the other is diffuse strain contrast arising from long range strain associated with the wall. These two contributions can be observed simultaneously or separately depending on the diffraction conditions. The long range strain is thought to be associated with the curvature of the domain walls. It appears that the main components of the displacement field associated with this strain are directed approximately perpendicular to the domain wall.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 310: Symposium N – Ferroelectric Thin Films III , 1993 , 29
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bierlein, J.D. and Vanherzeele, H., J. Opt. Soc. Am. B6, 622 (1989).CrossRefGoogle Scholar
2. Poel, C.J. van der, Bierlein, J.D., Brown, J.B. and Colak, S., Appl. Phys. Lett. 57, 2074 (1990).CrossRefGoogle Scholar
3. Cheng, L.K., Bierlein, J.D. and Ballman, A.A., J. Cryst. Growth, 110, 697 (1991)CrossRefGoogle Scholar
4. Tardjman, I., Masse, R. and Gritel, J.C., Z. Kristal. 139, 103 (1974).Google Scholar
5. Loiacono, G.M. and Stolzenberger, R.A., Appl. Phys. Lett. 53, 1498 (1988).CrossRefGoogle Scholar
6. Gashurov, G. and Belt, R.F. in Tunable Solid State Lasers for Remote Sensing, edited by Byer, R.L., Gustafson, E.K., Trebino, R., (Springer-Verlag, 1984), p. 119.Google Scholar
7. Ahmed, F., Belt, R.F. and Gashurov, G., J. Appl. Phys. 60, 839 (1986).CrossRefGoogle Scholar
8. Bierlein, J.D. and Amhed, F., Appl. Phys. Lett. 51, 1322 (1987).CrossRefGoogle Scholar
9. Laurell, F., Roelofs, M.G., Bindloss, W., Hsiung, H., Suna, A., and Beirlein, J.D., J. Appl. Phys. 71, 4664 (1992).CrossRefGoogle Scholar
10. Bolt, R.J., Haas, H. de, Sebastian, M.T. and Klapper, H., J. Cryst. Growth 110, 587 (1991).CrossRefGoogle Scholar
11. Halfpenny, P.J., O'Neill, L., Sherwood, J.N., Simpson, G.S., Yokotani, A., Miyamoto, A., Sasaki, T., and Nakai, S., J. Cryst. Growth 113, 722 (1991).CrossRefGoogle Scholar
12. Akaba, N., Susuki, S. and Takagi, M., J. Phys. Soc. Japan 46, 1583 (1979).CrossRefGoogle Scholar
13. Klapper, H., Prog. Crystal Growth and Charact. 14, 367 (1987).CrossRefGoogle Scholar
14. Miltat, J. in Characterization of Crystal Growth Defects by X-ray Methods, edited by Tanner, B.K. and Bowen, D.K, (Plenum, New York, 1980) pp. 401–420.CrossRefGoogle Scholar
15. Hart, M., J. Appl. Cryst. 8, 436 (1975).CrossRefGoogle Scholar
16. Chikawa, J., J. Appl. Cryst. 1, 165 (1968).CrossRefGoogle Scholar
17. International Tables for X-Ray Crystallography, Vol. 1, (Kynoch, Birmingham, 1952) p. 392.Google Scholar