Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-05-20T22:57:16.123Z Has data issue: false hasContentIssue false

Production and Characterization of Circularly Polarized Soft X-Rays for Materials Research at the ALS

Published online by Cambridge University Press:  15 February 2011

Anthony T. Young
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Jeffrey B. Kortright
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Zahid Hussain
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Vladimir Martynov
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Howard A. Padmore
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Tim Renner
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Neville V. Smith
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Tony Warwick
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Get access

Abstract

The experimental program at the Advanced Light Source to produce and characterize circularly polarized x-rays is described. A number of beamlines are either operating or under construction which produce circularly polarized light. Bend magnets, multilayer phase retarders, and insertion devices which directly produce circularly polarized radiation are described. These beamlines will have capabilities for both microscopy and high resolution spectroscopy. Measurements of the linear and circular polarization of these beamlines are also described.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Chen, C.T., Sette, F., Ma, Y., and Modesti, S., Ph vs. Rev. B. 42, 7262, (1990)Google Scholar
[2] Christiansen, J., Peng, G., Young, A.T., LaCroix, L.B., Solomon, E.I., and Cramer, S.P., Inorganica Chimica Acta, in pressGoogle Scholar
[3] Tobin, J.G. and Waddill, G.D., J. Appl. Phys. 75, 6369 (1994)Google Scholar
[4] Kaduwela, A.P., Xiao, H., Thevuthasan, S.; Fadley, C.S., and Hove, M.A. Van, Phys. Rev. B 52, 14927 (1995)Google Scholar
[5] Stohr, J., Wu, Y., Hermsmeier, B.D., Samant, M.G., Harp, G.R., Koranda, S., Dunham, D., and Tonner, B.P., Science 259, 658 (1993)Google Scholar
[6] Kortright, J.B., Rice, M., and Franck, K.D., Rev. Sci. Instrum. 66, 1569 (1995)Google Scholar
[7] Hussain, Z., Huff, W.R.A., Kellar, S.A., Moler, E.J., Heimann, P.A., McKinney, W., Cummings, C., Lauritzen, T., McKean, J.P.. Palomares, F.J., Wu, H., Zheng, Y., Padmore, H.A., Fadley, S.S., and Shirley, D.A., Rev. Sci. Instrwn, in pressGoogle Scholar
[8] Kortright, J.B., Kimura, H., Kikitin, V., Mayama, K., Yamamoto, M., and Yanagihara, M., Appl. Phys. Lett. 60, 2963 (1992)Google Scholar
[9] Warwick, Tony, Heimann, Phil, Mossessian, Dmitri, McKinney, Wayne, and Padmore, Howard, Rev. Sci. Instruin. 66, 2037 (1995)Google Scholar
[10] Young, A.T., Hoyer, E., Marks, S.. Martynov, V., Padmore, H.A., Plate, D., and Schlueter, R., Rev. Sci. Instrumn., in pressGoogle Scholar
[11] Sasaki, S., Miyata, L., and Takada, T., Jpn. J. Appl. Phys. 31, L1794 (1992)Google Scholar
[12] Carr, R. and Lydia, S., Proc. SPIE 2013, 56 (1993)Google Scholar