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Scanning Probe Microscopy Study of Layered Dichalcogenide ReS2

Published online by Cambridge University Press:  22 February 2011

Stephen P. Kelty ,
Albert F. Ruppert ,
Russell R. Chianelli ,
Jingqing Ren  and
Myung-Hwan Whangbo
Stephen P. Kelty
Affiliation:
Exxon Research and Engineering Company, Annandale, New Jersey 08801
Albert F. Ruppert
Affiliation:
Exxon Research and Engineering Company, Annandale, New Jersey 08801
Russell R. Chianelli
Affiliation:
Exxon Research and Engineering Company, Annandale, New Jersey 08801
Jingqing Ren
Affiliation:
Department of Chemistry, North Carolina State University, Raleigh, North Carolina 27695-8204
Myung-Hwan Whangbo
Affiliation:
Department of Chemistry, North Carolina State University, Raleigh, North Carolina 27695-8204
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Abstract

Single crystal ReS2 was characterized using atomic force microscopy (AFM) and scanning tunneling microscopy (STM). The observed atomic-resolution AFM and STM images were interpreted by calculating the total, p(r0), and partial electron density distribution, p(r0, ef), respectively, of a single ReS2 layer. The experimental and theoretical results indicate that the basal plane surface state density is dominated by contributions from the sulfur layer This is in contrast to bulk band structure calculations which would predict that the major contribution to the STM images should be from the Re atoms. Furthermore, the surface-to-tip STM images are found to be quite different from tip-to-surface images. By interpreting STM and AFM data from p(r0) and p(r0, ef) calculations, it is shown that site specific structural and electronic details of the surface can be elucidated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 327: Symposium N – Covalent Ceramics II: Non-Oxides , 1993 , 59
Copyright
Copyright © Materials Research Society 1994

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