Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Vendor Symposium

Abstract

Atom Probe Tomography with the Easier to Operate EIKOS™

Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity

Improving Sensitivity and Productivity with High count rate X-ray spectrum images

3D Mapping Grain Morphology and Grain Orientations by Laboratory Diffraction Contrast Tomography

Silicon Drift Detectors: Limitations for Throughput and Resolution

Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset

Stable and Flexible Side-Entry Stage for Nion STEMs

STEM and TEM: Disparate Magnification Definitions and a Way Out.

Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera

Advantages of Direct Detection and Electron Counting for Electron Energy Loss Spectroscopy Data Acquisition and the Quest of Extremely High-Energy Edges Using Eels

Development of Multiple New 120 kV Transmission Electron Microscope Configurations Applicable for a Wide Range of Fields

A New Core Facility For Electron And Ion Microscopy At The University Of Arizona

In situ Thermal Shock of Lunar and Planetary Materials Using A Newly Developed MEMS Heating Holder in A STEM/SEM

High Spatial Resolution and Wide Range EDS Analysis with FE-SEM

Application of Temperature Controlled Stage in Atmospheric Scanning Electron Microscopy

High Performance Silicon Drift Detectors

Improved Pump Down Time with Evactron® Turbo Plasma™ Cleaning

A Compact High Solid Angle EDX Detector System for SEM and TEM

Improved Characterization of Steel Samples by SEM/EDS Through the Use of a Silicon Drift Detector

X-ray Fluorescence Analysis in an Electron Microscope: Improved Spotsize of Polycapillary Focusing Optics at the IfG Modular X-ray Source (iMOXS/2®)

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Vendor Symposium

Abstract