Improvements in STEM and TEM Instrumentation for Materials Science Applications
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Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens
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- 01 August 2004, pp. 2-3
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First experimental proof of spatial resolution improvement in a monochromized and Cs-corrected TEM
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- 01 August 2004, pp. 4-5
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Sub-Ångstrom and sub-eV resolution with the analytical SATEM
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- 01 August 2004, pp. 6-7
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A New Double-Corrected HREM/STEM and its Applications for Advanced Materials
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- 01 August 2004, pp. 8-9
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Materials Applications of Aberration-Corrected STEM
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- 01 August 2004, pp. 12-13
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Prospects for Dynamic Experiments
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Toward Ultrafast Electron Microscopy
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- 01 August 2004, pp. 14-15
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Magnetic Imaging of Information Storage Materials
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- 01 August 2004, pp. 16-17
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HRTEM Image Simulation of Carbon Nanotubes Under Actual Growth Environment
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- 01 August 2004, pp. 18-19
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In Situ Experiments in the High-Voltage Microscope in Stuttgart: Need for Better Resolution?
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- 01 August 2004, pp. 20-21
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Aberration correction: Some Advantages and Alternatives
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- 01 August 2004, pp. 22-23
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Aberration-Corrected Electron Microscopy in Nanocatalysis
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- 01 August 2004, pp. 24-25
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Aberration Correction Beyond STEM and TEM Imaging
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Correction of Spherical Aberration in a Focused Ion Beam System by Means of Space Charge
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- 01 August 2004, pp. 26-27
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Abberation Correction Beyond STEM and TEM Imaging
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Outline of the Mirror Corrector for SMART and PEEM3
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- 01 August 2004, pp. 28-29
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Aberration Correction Beyond STEM and TEM Imaging
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Prospects for Aberration Corrected Nanocrystallogrphy
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- 01 August 2004, p. 30
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Monochromated ELS: History, Context and Opportunities
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- 01 August 2004, pp. 32-33
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SCEM and XEDS in the Next Generation Aberration Corrected Microscopes
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- 01 August 2004, pp. 34-35
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Abberation Correction Beyond STEM and TEM Imaging
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Aberration Minimized FESEM for Nanotechnology Applications
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- 01 August 2004, pp. 36-37
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Addressing Limits: Single Atom Detection
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Quantitative Aberration-corrected Transmission Electron Microscopy
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- 01 August 2004, pp. 38-40
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Electron Holography with Cs-corrected TEM
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- 01 August 2004, pp. 40-41
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Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid
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- 01 August 2004, pp. 44-45
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