SEM image of TiO2 nanostructures (VT = 20 mL). [C. Liu and X. Wang: Mesoporous titanium dioxide nanobelts: Synthesis, morphology evolution and photocatalytic properties. p. 2265.]
Focus Issue Introduction
Introduction
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- 22 August 2012, p. 2179
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Reviews
Ab initio description of quasiparticle band structures and optical near-edge absorption of transparent conducting oxides
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- 30 May 2012, pp. 2180-2189
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Hydrogen in oxide semiconductors
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- 18 May 2012, pp. 2190-2198
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Illumination instabilities in ZnO/HfO2 thin-film transistors and influence of grain boundary charge
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- 07 June 2012, pp. 2199-2204
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Transport and surface conductivity in ZnO
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- 22 May 2012, pp. 2205-2213
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Articles
Polarity-dependent photoemission of in situ cleaved zinc oxide single crystals
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- 30 July 2012, pp. 2214-2219
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Doping properties of hydrogen in ZnO
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- 03 July 2012, pp. 2220-2224
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Excitonic transport in ZnO
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- 14 June 2012, pp. 2225-2231
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Electron transport in semiconducting SnO2: Intentional bulk donors and acceptors, the interface, and the surface
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- 12 June 2012, pp. 2232-2236
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Creation of single oxygen vacancy on titanium dioxide surface
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- 07 June 2012, pp. 2237-2240
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Migration of point defects and a defect pair in zinc oxide using the dimer method
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- 25 May 2012, pp. 2241-2248
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Influence of the deposition temperature on electronic transport and structural properties of radio frequency magnetron-sputtered Zn1-xMgxO:Al and ZnO:Al films
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- 04 May 2012, pp. 2249-2256
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A study of (111) oriented epitaxial thin films of In2O3 on cubic Y-doped ZrO2 by synchrotron-based x-ray diffraction
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- 15 June 2012, pp. 2257-2264
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Mesoporous titanium dioxide nanobelts: Synthesis, morphology evolution, and photocatalytic properties
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- 30 May 2012, pp. 2265-2270
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The Meyer–Neldel rule in amorphous TiO2 films with different Fe content
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- 03 July 2012, pp. 2271-2277
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Effect of gallium doping and ball milling process on the thermoelectric performance of n-type ZnO
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- 24 July 2012, pp. 2278-2285
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Charge transport in solution-processed zinc tin oxide thin film transistors
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- 16 May 2012, pp. 2286-2292
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Effect of annealing temperature on the electrical characteristics of Ti–Zn–Sn–O thin-film transistors fabricated via a solution process
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- 18 May 2012, pp. 2293-2298
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Metallization strategies for In2O3-based amorphous oxide semiconductor materials
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- 03 July 2012, pp. 2299-2308
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Characterization of amorphous zinc tin oxide semiconductors
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- 12 June 2012, pp. 2309-2317
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