Technology and Software Development
A New Methodology to Analyze Instabilities in SEM Imaging
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- 20 October 2014, pp. 1625-1637
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Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
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- 05 November 2014, pp. 1638-1645
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A Multi-Step Transmission Electron Microscopy Sample Preparation Technique for Cracked, Heavily Damaged, Brittle Materials
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- 07 October 2014, pp. 1646-1653
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Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques
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- 14 October 2014, pp. 1654-1661
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The Maximum Separation Cluster Analysis Algorithm for Atom-Probe Tomography: Parameter Determination and Accuracy
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- 20 October 2014, pp. 1662-1671
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Resonant Frequency and Sensitivity of a Caliper Formed With Assembled Cantilever Probes Based on the Modified Strain Gradient Theory
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- 10 September 2014, pp. 1672-1681
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Materials Applications
Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy
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- 23 October 2014, pp. 1682-1691
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Dynamic Modeling and Simulation of Rough Cylindrical Micro/Nanoparticle Manipulation with Atomic Force Microscopy
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- 07 October 2014, pp. 1692-1707
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The Impact of Lubricants on the Precision Lapping Process
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- 12 November 2014, pp. 1708-1714
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The Influence of Experimental Parameters and Specimen Geometry on the Mass Spectra of Copper During Pulsed-Laser Atom-Probe Tomography
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- 12 November 2014, pp. 1715-1726
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Co-Precipitated and Collocated Carbides and Cu-Rich Precipitates in a Fe–Cu Steel Characterized by Atom-Probe Tomography
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- 25 September 2014, pp. 1727-1739
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Simultaneous Quantification of Indium and Nitrogen Concentration in InGaNAs Using HAADF-STEM
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- 30 September 2014, pp. 1740-1752
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Thickness and Rotational Effects in Simulated HRTEM Images of Graphene on Hexagonal Boron Nitride
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- 15 September 2014, pp. 1753-1763
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Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation
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- 17 November 2014, pp. 1764-1771
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Structure Identification in High-Resolution Transmission Electron Microscopic Images: An Example on Graphene
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- 12 November 2014, pp. 1772-1781
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Chemical Quantification of Atomic-Scale EDS Maps under Thin Specimen Conditions
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- 13 October 2014, pp. 1782-1790
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Atomic Scale Studies of La/Sr Ordering in Colossal Magnetoresistant La2−2xSr1+2xMn2O7 Single Crystals
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- 29 September 2014, pp. 1791-1797
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Microstructural Characterization of Dehydrogenated Products of the LiBH4-YH3 Composite
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- 28 October 2014, pp. 1798-1804
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Scanning Electron Microscopy and Transmitted Electron Backscatter Diffraction Examination of Asbestos Standard Reference Materials, Amphibole Particles of Differing Morphology, and Particle Phase Discrimination from Talc Ores
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- 23 October 2014, pp. 1805-1816
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In Situ Transmission Electron Microscopy of Ionic Conductivity and Reaction Mechanisms in Ultrathin Solid Oxide Fuel Cells
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- 10 November 2014, pp. 1817-1825
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