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Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 344-345
- Print publication:
- August 2014
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- Article
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Dry Techniques for Epitaxial Graphene Transfer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1259 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1259-S18-05
- Print publication:
- 2010
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Nondestructive defect measurement and surface analysis of 3C-SiC on Si (001) by electron channeling contrast imaging
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1068 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1068-C07-08
- Print publication:
- 2008
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