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Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 802-803
- Print publication:
- August 2018
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Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 618-619
- Print publication:
- July 2016
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Tailoring magnetic nanostructures with neon in the ion microscope
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1716-1717
- Print publication:
- July 2016
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