10 results
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 2 / April 2020
- Published online by Cambridge University Press:
- 12 March 2020, pp. 258-266
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- April 2020
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Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 314-315
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- August 2019
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A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source
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- Journal:
- MRS Advances / Volume 4 / Issue 44-45 / 2019
- Published online by Cambridge University Press:
- 03 July 2019, pp. 2367-2375
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- 2019
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Quantifying the 3-Dimensional Shape of Lunar Regolith Particles Using X-Ray Computed Tomography and Scanning Electron Microscopy at Sub-γ Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2194-2195
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- July 2017
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Chemical Segregation and Microstructural Evolution of Fiber Laser-Welded Low Carbon Sheet Steel
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1964-1965
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- July 2016
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Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 450-451
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- July 2016
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Localization and Number of Au Nanoparticles in Optically Indexed Cells by FIB Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 411-412
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- August 2015
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Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel With Use of Complementary Atom Probe Tomography and Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 954-955
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- August 2014
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Failure Analysis and Reliability of Low-Temperature-Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1762-1763
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- August 2014
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Atomic Resolution Transmission Electron Microscopy of Surfaces
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- Journal:
- Journal of Materials Research / Volume 20 / Issue 7 / July 2005
- Published online by Cambridge University Press:
- 01 July 2005, pp. 1619-1627
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- July 2005
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