5 results
Nanoprobe Endstation with Montel optics and Resolution 50 nm at Taiwan Photon Source
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 208-209
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- August 2018
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Information-tagged Data-acquisition System for On-the-fly Scanning
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 104-105
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- August 2018
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Exploiting the in-situ Electrical X-ray Microscopy for Semiconductor Nano Devices Analysis by X-ray Nanoprobe Beamline at Taiwan Photon Source
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 430-431
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- August 2018
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Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 198-199
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- August 2018
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Intrinsic point defects in ternary MgCaSi: Ab initio investigation
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 19 / 16 October 2017
- Published online by Cambridge University Press:
- 01 August 2017, pp. 3723-3731
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- 16 October 2017
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