17 results
Energy-Filtered Transmission Electron Microscope Tomography of Silicon Nanoparticles in Silicon Dioxide Deposited with High Density Plasma Chemical Vapor Deposition
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 810-811
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- August 2014
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A Model for the Critical Height for Dislocation Annihilation and Recombination in GaN Columns Deposited by Patterned Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 831 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, E11.29
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- 2004
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Mechanisms of Stacking Fault Growth in SiC PiN Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 815 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, J6.4
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- 2004
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The microstructure of GaN nucleation layers grown by MOCVD on (1120) sapphire versus pressure and temperature
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- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y5.32
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- 2003
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Extended Defects in 4H-SiC PiN Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 742 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, K3.7
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- 2002
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DNA Templating of Ethylene-Oxide-Coated Nanoclusters
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- Journal:
- MRS Online Proceedings Library Archive / Volume 735 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, C11.41
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- 2002
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Effect of growth temperature on the microstructure of the nucleation layers of GaN grown by MOCVD on (1120) sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 743 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, L3.19
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- 2002
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Microstructure of GaN Grown on (1120) Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 639 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, G3.9
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- 2000
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Ge-Related Interfacial Defects in Sige Alloy Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 453
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- 1995
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Ge-Related Interfacial Defects In SiGe Alloy Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 573
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- 1995
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Photoreflectance Characterization of Silicon Films on Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 188 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 349
- Print publication:
- 1990
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Plastic Flow in Si/Ge Quantum Well Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 160 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 83
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- 1989
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Elimination of Microtwins in Mbe-Grown Silicon on Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 138 / 1988
- Published online by Cambridge University Press:
- 28 February 2011, 409
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- 1988
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The Structure of Silicon Thin Films Grown on Sapphire by MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 107 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 389
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- 1987
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Relative Lattice Parameter Measurement in Quaternary (InGaAsP) Layers on InP Substrates Using Convergent Beam Electron Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 69 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 147
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- 1986
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Trapping of Oxygen at Homoepitaxial Si-Si Interfaces Grown by Molecular Beam Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 59 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 317
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- 1985
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The Application of Transmission Electron Microscopy to the Study of Ti-Diffused Lithium Niobate
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- Journal:
- MRS Online Proceedings Library Archive / Volume 60 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 421
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- 1985
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