3 results
Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1396 / 2012
- Published online by Cambridge University Press:
- 16 January 2012, mrsf11-1396-o07-27
- Print publication:
- 2012
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Spectroscopic Mapping Ellipsometry of Graphene Grown on 3C SiC
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1407 / 2012
- Published online by Cambridge University Press:
- 29 February 2012, mrsf11-1407-aa20-43
- Print publication:
- 2012
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Strain-free Low-defect-density Bulk GaN with Nonpolar Orientations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 955 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0955-I03-04
- Print publication:
- 2006
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