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Diffraction Plane Dependence of X-ray Elastic Constants of Alumina

Published online by Cambridge University Press:  06 March 2019

Masanori Kurita ,
Ikuo Ihara  and
Akira Saito
Masanori Kurita
Affiliation:
Nagaoka University of Technology Nagaoka, 940-21 Japan
Ikuo Ihara
Affiliation:
Nagaoka University of Technology Nagaoka, 940-21 Japan
Akira Saito
Affiliation:
Hitachi, Ltd. Chiyoda-ku, Tokyo, 101 Japan
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Abstract

The 95% confidence linits of the x-ray elastic and stress constants of α-alumina were detemined from seven kinds of diffraction planes by the Gaussian curve method in order to investigate the diffraction plane dependence of the eonstants. No difference in the elastic constants larger than their 95% confidence intervals was observed for most diffraction planes. Also, the measured elastic constants for most planes were closer to the values calculated from the Voigt model than those from the Reuss model. Since the diffraction line of the (410) plane measured with cobalt Kα radiation by using an automated x-ray stress analyzer locates at the highest diffraction angle of 168.4, the use of this plane will allow the most accurate stress measurement. Also, the measured x-ray elastic constants for the (410) plane almost agreed with both values calculated from the Voigt and Reuss models. Therefore, the (410) plane is the most appropriate plane for x-ray stress measurement of alumina.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 363 - 372
Copyright
Copyright © International Centre for Diffraction Data 1989

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