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A Generalized Matrix Correction Approach for Energy-Dispersive X-Ray Fluorescence Analysis of Paint Using Fundamental Parameters and Scattered Silver Kα Peaks

Published online by Cambridge University Press:  06 March 2019

Leif Højslet Christensen  and
Iver Drabæk
Leif Højslet Christensen
Affiliation:
Isotope Division, Risø National laboratory, DK-4000 Roskilde, Denmark
Iver Drabæk
Affiliation:
Danish Isotope Centre, Skelbaskgade 2, DK - 1717 Copenhagen V, Denmark
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Abstract

An energy-dispersive x-ray fluorescence method has been developed for the direct determination of major and minor elements in infinitely thick samples of paint. Matrix absorption and enhancement corrections are iteratively calculated from a knowledge of tabulated fundamental parameters and the unknown weight fractions. An estimate of the significant light element fraction of the bulk sample required for the calculation of matrix attenuation is obtained using the scatter peaks of the silver secondary target. Relative elemental calibration constants and calibration factors for the coherent and incoherent peaks are determined experimentally using either thin-film standards or standards of known total composition. For routine analysis only one absolute standard is required. The method has been applied to different types of paint with a relative standard deviation better than 5% provided the counting statistics are not the limiting factor. The accuracy has been tested by comparing own results with those obtained either from the formulation or from, instrumental neutron activation analysis.

Type
VII. XRF Computer Systems and Mathematical Corrections
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 377 - 384
Copyright
Copyright © International Centre for Diffraction Data 1982

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