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High Temperature Guinier X-Ray Diffractometry for Thermal Expansion Measurements in the Hexagonal form of Cordierite ((2MgO·2Al2O3·5SiO2)*

Published online by Cambridge University Press:  06 March 2019

J. S. Pressnall ,
J. J. Fitzpatrick  and
Paul Predecki
J. S. Pressnall
Affiliation:
University of Denver, Denver, CO 80208
J. J. Fitzpatrick
Affiliation:
University of Denver, Denver, CO 80208
Paul Predecki
Affiliation:
University of Denver, Denver, CO 80208
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Abstract

A computer-controlled high temperature Guinier diffractometer system for accurate determination of lattice thermal expansion is described. A critical test of the system using α-Al2O3 (0.3μ polishing alumina) showed close agreement with the single crystal expansion data of Wachtman et al. Lattice thermal expansion of cordierite doped with the following dopants: Ge+4, P+5, Zn+2, Li+1 and Ca+2 was investigated. Of these the Li+1 at the 5% level (5% of Si+4 replaced by Li+1 + Al+3) produced the largest decrease in mean lattice expansion.

Type
V. Other XRD Applications
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 397 - 404
Copyright
Copyright © International Centre for Diffraction Data 1983

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Footnotes

**

Present address: Systems Planning Corp., Arlington, VA

*

Work supported by DOE on contract DE-AC02-81ER10896.

References

1. Meagher, E. P. and Gibbs, G. V., The Polymorphism of Cordierite I; The Crystal Structure of Low Cordierite, Canad. Mineralogist 15:43 (1977).Google Scholar
2. Gibbs, G. V., The Polymorphism of Cordierite I:The Crystal Structure of Low Cordierite, Aroer, Mineralogist 51:1068 (1966).Google Scholar
3. Milberg, M. E. and Blair, H. D., Thermal Expansion of Cordierite, Am. Ceram. Soc. 60:372 (1977).Google Scholar
4. Wachtman, J. B., Jr., Scuderi, T. G., and Cleek, G. W., Linear Thermal Expansion of Al2O3 and ThO2 from 100 to 1100°K. J. Am. Ceram. Soc. 45:319 (1962).Google Scholar
5. Pressnall, J. S., Thesis, M.S., Univ. of Denver (Dept. of Physics), (1983) .Google Scholar