Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-06-16T21:35:35.569Z Has data issue: false hasContentIssue false

On-Line Type X-Ray Emission Analyzer Systems

Published online by Cambridge University Press:  06 March 2019

A.D. Furbee*
Affiliation:
General Electric Company Milwaukee, Wisconsin
Get access

Abstract

This paper describes equipment and performance characteristics of an X-ray emission analyzer designed specifically for continuous, 24-hr on-line process chemical analysis and control. Analysis of elements from Mg (12) upward in the periodic chart are generally feasible.

The basic instrument is a multichannel spectrometer with provision for the simultaneous analysis of up to six elements. Either curved or flat crystals may be used as dictated by the particular application for which it is intended. X-ray detection is accomplished with flow proportional, sealed proportional, and scintillation detectors with both counter tube gas and electronic discrimination against undesired X-rays. The instrument is designed for excellent stability with provision for either automatic or simple manual standardization for long-term drift. A helium atmosphere is used for light elements, and through great care in spectrometer head design consumption is limited to 1 ft3/hr. A number of sample-presenting apparatus have been designed as companions to the basic equipment, including a continuous automatic powder, slurry, and liquid presenter. The powder presenter is particularly adaptable Co continuous analysis of materials which are finely ground (e.g., -200 mesh), whereas the slurry presenter is adaptable to continuous monitoring of solutions or finely ground particles in a slurry state. Readout is available as a d-c signal suitable for strip-chart recorders, voltmeters, data loggers, computers, and control. Digital readout and print out are also available. Performance tests in both the laboratory and field indicate an instrument suitable for on-line process use in a wide variety of industries, including cement, steel, mining, petroleum, and chemicals.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1961

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Compton, A. H. and Allison, S. K., X-Rays in Theory and Experiment, D. Van Nostrand Company, Princeton, N. J., 1935.Google Scholar
2. Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H., Zemany, P. D., X-Ray Absorption and Emission in Analytical Chemistry, John Wiley & Sons, New York, 1960.Google Scholar
3. Birks, L. S., X-Ray Spectrocftemical Analysis, Interscience Publishers, Inc., New York, 1960.Google Scholar
4. Loranger, W. “On-Line Analysis by X-Ray Emission Technique, “ 12th Annual Symposium on Spectroscopy, Chicago, Illinois, May 16, 1961.Google Scholar
5. Bernstein, F. “Application of X-Ray Fluorescence to Process Control” 10th Annual Conference, Applications of X-Ray Analysis, University of Denver, August, 1961.Google Scholar