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Projection Microscopy and Microanalyses*

Published online by Cambridge University Press:  06 March 2019

Ong Sing Poen
Ong Sing Poen*
Affiliation:
Pomona College, Physics Department, Claremont, California
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Abstract

Results of recent experiments on microanalyses with an X-ray projection microscope will be reviewed. As the use of monochromatic radiation is imperative, spectral analyses of the point source were carried out. A simple stationary divergent-beam-type transmission spectrograph was used. The shape and size were miniaturized to fit in the specimen holder of the Norelco projection unit. Emission spectra from clean, targets and the fluorescent radiation emerging from a 10- to 50-μ-diameter spot of contaminated targets and of two-layer targets will be shown. The spectra were recorded photographically. In addition, a proportional counter, in combination with the R.C.L. 128-channel pulse-height analyzer, was used for measuring the ratio of “white” to line radiation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 324 - 334
Copyright
Copyright © International Centre for Diffraction Data 1961

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Footnotes

†

North American Philips Research Fellow at Pomona College.

*

This work is supported by the Office of Scientific Research, U. S. Air Force.

References

1.“X-Ray Microscopy and Microradiography,” in V.E. Cosslett, A. Enström, and H.H. Pattee, Jr. (ed.) Proceedings of the Symposium held at the Cavendish Laboratory, Cambridge, 1956, Academic Press, Inc., New York.Google Scholar
2. Castaing, R. and Guinier, A., Proceedings, Conference Electron Microscopy, Delft, 1949.Google Scholar
3. Parrish, W., “X-Ray Spectrochemicat Analyses,” Norelco Reporter, Vol. III, 1956, p. 24.Google Scholar
4. Ong, S. P., “Isolation of Selected Elemems with an X-ray Projection Microscope,” Norelco Reporter, Vol. VIII. 1961, p. 3.Google Scholar
5. Bessen, I. I., “Selection of Spectra for X-ray Microscopy,” Advances in X-Ray Analysis, Vol. 2, University of Denver, Plenum Press, New York, 1960, pp. 79–95.Google Scholar
6. Rutherford, E. and Andrade, E.N. Da C., “Spectrum of the Penetrating y Ray from Radium,” Phil. Mag., Vol. 28, 1914, p. 263.Google Scholar
7. Parrish, W. and Kohler, T. R., “Use of Counter Tubes in X-Ray Analysis,” Rev. Sci. Instr., Vol. 27, 1956, p. 795.Google Scholar