Hostname: page-component-76fb5796d-dfsvx Total loading time: 0 Render date: 2024-04-26T00:47:17.498Z Has data issue: false hasContentIssue false

Quantitative X-Ray Fluorescence Analysis for Fly Ash Samples

Published online by Cambridge University Press:  06 March 2019

Scott Schlorholtz
Affiliation:
Iowa State University Engineering Research Institute, Materials Analysis and Research Laboratory, Ames, Iowa
Mustafa Boybay
Affiliation:
Iowa State University Engineering Research Institute, Materials Analysis and Research Laboratory, Ames, Iowa
Get access

Extract

The disposal of fly ash from coal burning power plants is rapidly becoming an environmentally complex problem. Recently though, the attitude towards fly ash use has been changing from a disposal oriented point of view to a more rational position which considers fly ash as a resource to be recycled. One major hinderance of fly ash use has been the extreme variability of composition that exists between fly ashes produced at different power plants. This variability makes the analysis of fly ash very important.

The most common methods currently used for fly ash analysis are atomic absorption or wet chemistry methods defined in ASTM C311. Both methods tend to be expensive, time consuming, and sample preparation is both tedious and critical for some elements. In this study X-ray fluorescence (QXRF) is used for the quantitative analysis of the major and minor elements found in “typical” fly ashes. The method, which is computer controlled, is quick, reliable, and requires minimal sample preparation.

Type
VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. American Society for Testing and Materials, 1981 Annual Book of ASTM Standards. Part 4. Philadelphia:ASTM, 1981.Google Scholar
2. Bertin, Eugene P., Principles and Practices of X-ray Spectrometric Analysis, 2nd edition, New York:Plenum Press, 1975.Google Scholar
3. Plesch, R. and Thiele, G., “Fundamentals of the Siemens Computer Programs for X-ray Spectrometry,” Siemens X-ray Analytical Application Note, No. 33, Sept. 1977.Google Scholar
4. Leoux and Think, “Revised Tables of X-ray Mass Attenuation Coefficient,” Corporation Scientifique Claisse, Inc. Quebec, Canada.Google Scholar
5. Beard, D. W. and Reed, B. G., “Matrix,” Siemens X-ray Application for SRS 200. February 1982.Google Scholar