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Reflection Intensity Dependence on Surface and Wavelength from LiF and EDDT Analyzer Crystals

Published online by Cambridge University Press:  06 March 2019

K. Toh ,
T. Ui  and
E. Asada
K. Toh
Affiliation:
Toyohashi University of Technology Toyohashi 440, Japan
T. Ui
Affiliation:
Toyohashi University of Technology Toyohashi 440, Japan
E. Asada
Affiliation:
Toyohashi University of Technology Toyohashi 440, Japan
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Extract

It has been recognized that more nearly perfect crystal surfaces have a low intensity of X-ray reflection as a result of extinction effects. Therefore, it has been common practice to abrade analyzer crystals used in X-ray fluorescence analysis so that they approximate so-called mosaic crystals.

While investigating the intensity of reflection from various ADP crystals about 10 years ago, one of the authors (A) and his colleague discovered that wavelength dependence of the intensity of reflection widely varied among crystals. in other words, crystals that had a high reflection intensity for short wavelengths displayed a low reflection intensity for long wavelengths, and crystals effective for long wavelengths were not effective for short wavelengths. Also, they discovered that this phenomenon was related to the perfect quality of the crystal surfaces. As-grown crystals were more effective for longer wavelengths than commercially available crystals into which a certain amount of imperfection presumably had been introduced.

Type
IV. Recent Developments in Long-Wavelength Spectroscopy
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 119 - 126
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

1. Kato, C. and Asada, E., Treatment and X- ray Reflection Intensity of Solution-grown ADP Crystal, Japan Analyst, 20:713 (1971), in Japanese.Google Scholar
2. Asada, E. and Takiguchi, T., Correlation between Crystal Perfection and Reflection Intensity of Analyzer Crystal for X- Ray Specrtra, Jpn. J. of Appl. Phys., 17:687 (1978).Google Scholar