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Synchrotron and Laboratory Studies Utilizing a New Powder Diffraction Technique

Published online by Cambridge University Press:  06 March 2019

G. S. Knapp ,
M. A. Beno ,
G. Jennings ,
M. Engbretson  and
M. Ramanathan
G. S. Knapp
Affiliation:
Argonne National Laboratory, Argonne IL 60439
M. A. Beno
Affiliation:
Argonne National Laboratory, Argonne IL 60439
G. Jennings
Affiliation:
Argonne National Laboratory, Argonne IL 60439
M. Engbretson
Affiliation:
Argonne National Laboratory, Argonne IL 60439
M. Ramanathan
Affiliation:
Argonne National Laboratory, Argonne IL 60439
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Abstract

We have developed a new type of powder diffractometer. The diffractometer has the potential of both high count rates and very high resolution when used at a synchrotron source. The laboratory based instrument can achieve an order of magnitude improvement in count rate over existing methods with proper optics. The method uses a focusing diffracted beam monochromator in combination with a multichannel detector. The incident x-rays fall on a flat plate or capillary sample and are intercepted by a bent focusing monochromator which has the focus of the bend at the sample surface. The powder diffraction lines emerging from the bent crystal monochromator are detected by a linear or 2-dimensional detector. This allows us to eliminate the background from fluorescence or other scattering and to take data over a range of 3° to 4° instead of one angle at a time thereby providing a large improvement over conventional diffractometers.

Type
X. XRD Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 653 - 661
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

1. Bragg, W. H., Proc. Phys. Soc. Lond., 52, 222 (1921).Google Scholar
2. Brentano, J., Arch. Sci. Phys. Nat., 44. 66(1917).Google Scholar
3. Ballon, J., Comparat, V., and Pouxe, J. Nuclear Instruments and Methods. 217: 213 (1983).Google Scholar
4.An example of this type of detector is the Inel CPS 120 System, detector is marketed by Intel Buc France.Google Scholar
5. Knapp, G. S. and Beno, M. A., U. S. Patent Application Serial No. 07/811,060, Filed December 19, 1991.Google Scholar
6.For an explanation of parafocusing see, for example H. P. King and L. E. Alexander , “X-ray Diffraction Procedures” John Wiley and Sons, Inc. New York, London, 211–218, (1954).Google Scholar
7. Johansson, T., Naturwissenschaften 20, 758 (1932).Google Scholar
8.We use a Bragg-Brentano type diffractometer marketed by Rigaku USA, Inc. Danvers MA, USA.Google Scholar
9. Veal, B. W., Paulikas, A. P., You, H., Shi, H., Fang, Y., and Downey, J. W., Phys. Rev., B42, 6305 (1990).Google Scholar
10.GSAS, General Structure Analysis System, A. C. Larson and R. B. Von Dreele, LAUR 86-748, (1990).Google Scholar
11. Cox, D. E., in “Handbook on Synchrotron Radation” G.S. Brown and D. E. Moncton Editors, North-Holland, Elsevier Science Publishing, New York, 187–188, (1991).Google Scholar
12. Toby, B. H. and Egami, T., Acta Cryst., A48, 336 (1992).Google Scholar