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Synchrotron Radiation X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

John V. Gilfrich
John V. Gilfrich*
Affiliation:
Dynamics of Solids Branch, Naval Research Laboratory, Washington, DC 20375-5000
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Extract

The physical principles giving rise to synchrotron radiation(SR), the facilities necessary to make use of this source of radiation and the way in which it can be used for x-ray diffraction experiments have been described in other parts of this proceedings. The use of synchrotron radiation as an excitation source for x-ray fluorescence takes advantage of many of its unique properties to provide the potential for an improved analytical capability, beyond that which can be realized with more conventional laboratory x-ray sources. Workers around the world are studying this application (as well as a wide variety of others) , to establish the potential of this technique. Table 1 lists some of the facilities where significant XRF effort is being expended. This list is not intended to be complete, but just to convey some idea of the magnitude of the research which is being carried out.

Type
I. High Brilliance Sources/Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 1 - 7
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Gilfrich, J.V., Skelton, E.F., Nagel, D.J., Webb, A.W., Qadri, S.B., and Kirkland, J.P., X-Ray Fluorescence Analysis using Synchrotron Radiation, in “Advances in X-Ray Analysis” Vol. 26, Hubbard, C.R., Barrett, C.S., Predecki, P.K. and Leyden, D.E., eds. , Plenum Publ. Co. , New York (1983).Google Scholar
2. Gilfrich, J.V., Skelton, E.F., Qadri, S.B., Kirkland, J.P., and Nagel, D.J., Synchrotron Radiation X-Ray Fluorescence Analysis, Anal. Chem. 55: 187 (1983).Google Scholar
3. Gilfrich, J.V., Naval Research Laboratory, unpublished data (1987).Google Scholar
4. Iida, A., Gohshi, Y., and Maezawa, H., Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination, in “Advances in X-ray Analysis” Vol. 29, Barrett, C. S., Cohen, J.B., Faber, J. Jr. , Jenkins, R., Leyden, D.E., Russ, J.C. and Predecki, P.K., eds. , Plenum Publ. Co. , New York (1986).Google Scholar
5. Iida, A., Sakurai, K., Matsushita, T., and Gohshi, Y., Energy Dispersive X-Ray Fluorescence Analysis with Synchrotron Radiation, Nucl. Instr. and Meth. in Phys. Res. 228: 556 (1985),Google Scholar
6. Ice, G.E. and Sparks, C.J. Jr. , Focusing Optics for a Synchrotron XRadiation Microprobe, Nucl. Instr. and Meth. in Phvs. Res. 222: 121 (1984).Google Scholar
7. European Science Foundation, “European Synchrotron Radiation Facility: Supplement I, The Scientific Case,” Farge, Y. and Duke, P.J., eds. , ’ Strasbourg (1979), pp. 78-82.Google Scholar
8. Sparks, C.J. Jr. , X-Ray Fluorescence Microprobe for Chemical Analysis, in “Synchrotron Radiation Research,” Winick, H. and Doniach, S., eds. , Plenum Publ. Co. , New York (1980).Google Scholar
9. Bowen, D.K., Davies, S.T., and Ambridge, T., Quantitative Analysis of Arsenic-Implanted Layers in Silicon by Synchrotron-Radiation-Excited X-Ray Fluorescence, J. Appl. Phys. 58: 260 (1985).Google Scholar
10. Jones, K.W., Gordon, B.M., Hanson, A.L. Johnson, B.M., Meron, M., Pounds, J. G., Smith, J.V., Rivers, M.L., and Sutton, S.R., FY 1987 Research Activities on the X-26 Beam Port, in “National Synchrotron Light Source Annual Report 1987,” BHL Report 52131, S. White-DePace, Gmur, N.F. and Thomlinson, W., eds. , Brookhaven National Laboratory, New York (1987).Google Scholar
11. Rarback, H., Shu, D., Feng, S. C., Ade, H., Kirz, J., McNulty, I., Kern, D.P., Chang, T.H.P., Vladimirsky, Y., Iskander, N., Attwood, D., McQuaid, K., and Rothman, S., Scanning X-Ray Microscope with 75-mm Resolution, Rev. Sci. Instrum. 59: 52 (1988).Google Scholar
12. Iida, A. and Gohshi, Y., Energy Dispersive X-Ray Fluorescence Analysis using Synchrotron Radiation, in “Advances in X-Ray Analysis,” Vol. 28, Barrett, C.S., Predecki, P.K. and Leyden, D.E., eds. , Plenum Publ. Co. , New York (19S5).Google Scholar
13. Kirkland, J.P., Gilfrich, J.V., and Elam, W.T., Appearance Potential X-Ray Fluorescence Analysis, in “Advances in X-Ray Analysis,” Vol. 31, Barrett, C.S., Gilfrich, J.V., Jenkins, R., Russ, J.C., Richardson, J.W. Jr. , and Predecki, P.K., eds. , Plenum Publ. Co. , New York (1988).Google Scholar