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Vacuum X-Ray Instrumentation and its Application to Mill-Products Control

Published online by Cambridge University Press:  06 March 2019

H. T. Dryer
Affiliation:
Applied Research Laboratories Dearborn, Michigan
E. Davidson
Affiliation:
Applied Research Laboratories Glendale, California
G. Andermann
Affiliation:
Applied Research Laboratories Glendale, California
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Abstract

With the introduction in 1960 of the first commercial multichannel vacuum X-ray spectrometers, ARL opened the way for greater economy of operation for light-element analysis over conventional helium-path instrumentation. The design concepts and features of these instruments are discussed, including the adaptability to “on-stream” or continuous analyzer programs. The successful application of vacuum X-ray equipment for the analysis of ores, concentrates, and slags will be presented. Factors relating to sample preparation, precision, and accuracy are given and analytical sensitivity and speed are covered.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1961

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