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X-Ray Spectrographs Analysis of Traces in Metals by Preconcentration Techniques

Published online by Cambridge University Press:  06 March 2019

C. M. Davis ,
Keith E. Burke  and
M. M. Yanak
C. M. Davis
Affiliation:
The International Nickel Company, Inc. Paul D. Merica Research Laboratory Sterling Forest, Suffern, New York
Keith E. Burke
Affiliation:
The International Nickel Company, Inc. Paul D. Merica Research Laboratory Sterling Forest, Suffern, New York
M. M. Yanak
Affiliation:
The International Nickel Company, Inc. Paul D. Merica Research Laboratory Sterling Forest, Suffern, New York
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Abstract

Chemical separation techniques with their roots in classical analysis have been highly developed since the turn of the century. During the last two decades, X-ray spectrography has proven to be a very acceptable method of analysis because of the relative ease and rapidity of measurement of the intensity of characteristic wavelengths, the ready knowledge of the precision of the measurement, the facility of automating the analysis, and the nondestructive nature of the method. When chemical separation techniques are combined with X-ray spectrography, the problem of matrix effects is eliminated and the element being analyzed is substantially concentrated, which affords a means of performing trace element analyses. Published examples of preconcentration followed by X-ray measurement both outside and in the field of metallurgy are cited.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 11: Sixteenth Annual Conference on Applications of X-ray Analysis, August 9-11, 1967 , 1967 , pp. 56 - 62
Copyright
Copyright © International Centre for Diffraction Data 1967

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