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A 4D STEM-in-SEM Analysis of Hexagonal Boron Nitride

Published online by Cambridge University Press:  30 July 2021

Jason Holm  and
Elisabeth Mansfield
Jason Holm
Affiliation:
NIST, Boulder, Colorado, United States
Elisabeth Mansfield
Affiliation:
NIST, Boulder, Colorado, United States

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1824 - 1825
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Zastro, M., Nature, 2019 (572) 429-432.CrossRefGoogle Scholar
Caplins, B. W., et al. , Ultramicroscopy, 2020 (291) 113137.CrossRefGoogle Scholar
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