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5D-STEM: Live processing and display at 15,000 diffraction patterns per second

Published online by Cambridge University Press:  30 July 2021

Andreas Mittelberger
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Benedikt Haas
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States
Benjamin Plotkin-Swing
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Chris Meyer
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, Washington, United States
Niklas Dellby
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Luca Piazza
Affiliation:
DECTRIS Ltd., Taefernweg 1, 5405 Baden-Daettwil, Switzerland, United States
Ondrej Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Christoph Koch
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States
Tracy Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States

Abstract

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Type
Vendor Symposium
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Plotkin-Swing, B. et al., Ultramicroscopy 217, 113067 (2020).Google Scholar
Meyer, C. et al., Microscop. Microanal. 25 (Suppl 2), 122 (2019). https://github.com/nion-software/nionswiftCrossRefGoogle Scholar
Haas, B. et al., Microscop. Microanal. 26 (Suppl 2), 1898 (2020), and this meeting.CrossRefGoogle Scholar