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Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages

Published online by Cambridge University Press:  23 September 2015

Takaki Ishikawa ,
Eiji Okunishi ,
Toshikatsu Kaneyama ,
Yukihito Kondo  and
Syo Matsumura
Takaki Ishikawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan
Eiji Okunishi
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan
Toshikatsu Kaneyama
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan
Syo Matsumura
Affiliation:
Research laboratory of high-voltage electron microscope, Kyushu University, Motooka 744 Nishi-ku Fukuoka 819-0395Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1599 - 1600
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Suenaga project, "Low-voltage TEM/STEM for atomic level characterization of soft matters", CREST (2006-2012) Japan Science & Technology Agency..Google Scholar
[2] Salve project, Sub-Angstrom Low-Voltage Electron Microscopy (SALVE) I-II project (2008~)..Google Scholar
[3] Kawai, S, et al, Microscopy and Microanalysis 20 (S3) (2014) p. 1150.CrossRefGoogle Scholar