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Aberration-corrected Precession Electron Diffraction

Published online by Cambridge University Press:  05 August 2007

CS Own ,
N Dellby ,
O Krivanek ,
LD Marks  and
M Murfitt
CS Own
Affiliation:
Nion Company
N Dellby
Affiliation:
Nion Company
O Krivanek
Affiliation:
Nion Company
LD Marks
Affiliation:
Northwestern University
M Murfitt
Affiliation:
Nion Company
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 96 - 97
Copyright
© 2007 Microscopy Society of America

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