Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-30T06:58:06.127Z Has data issue: false hasContentIssue false
  • English
  • Français

Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals

Published online by Cambridge University Press:  01 August 2004

Nobuo Tanaka ,
Tomoykui Kawai  and
Jun Yamasaki
Nobuo Tanaka
Affiliation:
Nagoya Univesity, Japan
Tomoykui Kawai
Affiliation:
Nagoya Univesity, Japan
Jun Yamasaki
Affiliation:
Nagoya Univesity, Japan
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1006 - 1007
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)