Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-05-23T17:46:18.370Z Has data issue: false hasContentIssue false

The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.

Published online by Cambridge University Press:  05 August 2007

PA van Aken
Affiliation:
Max Planck Institute for Metals Research
CT Koch
Affiliation:
Max Planck Institute for Metals Research
W Sigle
Affiliation:
Max Planck Institute for Metals Research
R Höschen
Affiliation:
Max Planck Institute for Metals Research
M Rühle
Affiliation:
Max Planck Institute for Metals Research
E Essers
Affiliation:
Carl Zeiss SMT
G Benner
Affiliation:
Carl Zeiss SMT
M Matijevic
Affiliation:
Carl Zeiss SMT
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)